Scanning tunnelling microscopy (STM) shows the three-dimensional morphology of sample surfaces at the atomic level. Nanovie STM Phaino is powered by dual scanners, one for high resolution while the other for large scan range. The scanners can be switched from one another depending on the size of the structures or for the sake of positioning, and it takes only one single push.
The above parameters may vary depending on calibration.
Nanovie STM Phaino provides a nanoscale positioning stage, allowing sample movement between scans. There is no more need to fully retract and re-approach the tip evey time repositioning is required. The high magnification CCD camera, confocal to the probe tip, allows the users to examine and easily search for the region of interest at a micrometer scale before digging into nanoscale scanning.
As semiconductor fabrication reached the 10-nm node and beyond, it became more and more crucial to be able to probe and identify the electronic properties of materials at a nanoscopic level, such as the local density of electronic states (LDOS) and the band gap. While STM offers the most precise probing and the highest electronic spectroscopy sensitivity compared to other probing systems, Nanovie STM further made it simple and efficient to find the nanostructures in question.
Nanovie Auto Tip Maker (ATM) can produce up to 6 probe tips per batch, alleviating the troubles to make tips manually. Each tip has a curvature radius of about 15 nm, offering superior and reliable resolving power even for UHV STM.
Nanovie STM Phaino is a compact yet robust workhorse for atomic / nanoscopic surface analysis, providing both 3D morphology and electronic spectroscopy at the same time. With the ease of use and all commercial grade features and options, it is ideal for both industrial inspection and academic research.
STM Main Body:
Sample Working Space: